The electrical band-gap energy of porous silicon measured versus sample temperature

Research output: Contribution to journalConference articleResearchpeer-review

Photocurrent measurements have been carried out on a series of samples consisting of porous silicon on top of crystalline silicon, in the temperature range 10-300 K. From the experimental data set, the electrical band-gap energy of porous silicon is deduced to be (1.80 ±0.01) eV, independent of sample temperature. The results are discussed with the conclusion that for the samples studied here, the electrical bandgap in porous silicon is of molecular nature and cannot be related to quantum-confinement properties of nanocrystals of elemental silicon.

Original languageEnglish
JournalJournal of Porous Materials
Volume7
Issue number1-3
Pages (from-to)271-273
Number of pages3
ISSN1380-2224
DOIs
Publication statusPublished - 2000
EventProceedings of the 1998 1st International Conference on Porous Semiconductors - Science and Technology (PSST-98) - Mallorca, Spain
Duration: 16 Mar 199820 Mar 1998

Conference

ConferenceProceedings of the 1998 1st International Conference on Porous Semiconductors - Science and Technology (PSST-98)
CountrySpain
CityMallorca
Period16/03/199820/03/1998

    Research areas

  • Energy band gap, Photoconductivity, Porous silicon

ID: 326347741