The electrical band-gap energy of porous silicon measured versus sample temperature

Publikation: Bidrag til tidsskriftKonferenceartikelForskningfagfællebedømt

Photocurrent measurements have been carried out on a series of samples consisting of porous silicon on top of crystalline silicon, in the temperature range 10-300 K. From the experimental data set, the electrical band-gap energy of porous silicon is deduced to be (1.80 ±0.01) eV, independent of sample temperature. The results are discussed with the conclusion that for the samples studied here, the electrical bandgap in porous silicon is of molecular nature and cannot be related to quantum-confinement properties of nanocrystals of elemental silicon.

OriginalsprogEngelsk
TidsskriftJournal of Porous Materials
Vol/bind7
Udgave nummer1-3
Sider (fra-til)271-273
Antal sider3
ISSN1380-2224
DOI
StatusUdgivet - 2000
BegivenhedProceedings of the 1998 1st International Conference on Porous Semiconductors - Science and Technology (PSST-98) - Mallorca, Spanien
Varighed: 16 mar. 199820 mar. 1998

Konference

KonferenceProceedings of the 1998 1st International Conference on Porous Semiconductors - Science and Technology (PSST-98)
LandSpanien
ByMallorca
Periode16/03/199820/03/1998

Bibliografisk note

(Ekstern)

ID: 326347741